Name | Yuval Abulafua |
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Affiliation/Institute | Technion |
Title | Measuring Topological Numbers Using STM Dislocations |
Abstract (text only) | We propose a way to systematically measure topological winding numbers in 2D materials with chiral symmetry. We consider the example of graphene with a vacancy, and we prove that it is topological according to the tenfold classification generalised to defects by Teo and Kane. As a result of bulk-edge correspondence, topological edge states appear in the spectrum (zero modes) |