| Name | Yuval Abulafua | 
|---|---|
| Affiliation/Institute | Technion | 
| Title | Measuring Topological Numbers Using STM Dislocations | 
| Abstract (text only) | We propose a way to systematically measure topological winding numbers in 2D materials with chiral symmetry. We consider the example of graphene with a vacancy, and we prove that it is topological according to the tenfold classification generalised to defects by Teo and Kane. As a result of bulk-edge correspondence, topological edge states appear in the spectrum (zero modes)  | 
