We study low-dimensional materials. Our goal is to understand the behavior of materials by carefully measuring their electronic-structure.
Our main tool is Angle Resolved Photoemission Spectroscopy (ARPES) but we also use a variety of transport measurements to characterize our samples. We work on a variety of systems including, High-Tc cuprates, Fe-based superconductors, Mott insulators and Topological insulators and superconductors. For our experiments, we grow single-crystals using different growth techniques.
![ARPES intensity as a function of the binding energy for an highly doped Bi2Se3 crystal.](https://phsites.technion.ac.il/arpes/wp-content/uploads/sites/28/2015/07/Bi2Se3-video.gif)